Title: Secondary Electron Yield of SRF Materials
Author: Sarah Aull
Institution: CERN
Abstract: In the quest of new materials for SRF applications, the secondary electron yield (SEY) needs also to be taken into consideration. A high SEY holds the risk that multipacting becomes again a main performance limitation of an SRF cavity. In the worst case, a too high SEY makes a material completely unsuitablefor an RF exposed surface. This talk will discuss general aspects of the role of the surface condition and present SEY measurements on different SRF relevant materials, i.e. MgB2, Nb3Sn and NbTiN.
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