Surface topography investigation for thin film SRF – Genfa Wu – TFSRF-2010

Title: Surface topography investigation for thin film SRF
Author: Genfa Wu
Institution: Fermilab
Abstract: The general surface topography will be discussed for various niobium cavities. The field enhancement factor for both niobium or thin film cavities will have different effects. Their implications for thin film based cavities will require investment in extensive surface preparations for cavity substrate cavities. The surface preparation effort at Fermilab will be discussed for future new material effort.

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